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Tuneable interplay between atomistic defects morphology and electrical properties of transparent p-type highly conductive off-stoichiometric Cu-Cr-O delafossite thin films.

ABSTRACT: Off-stoichiometric copper chromium delafossites demonstrate the highest values of electric conductivity among the p-type transparent conducting oxides. Morphological and structural changes in Cu0.66Cr1.33O2 upon annealing processes are investigated. Chained copper vacancies were previously suggested as source of the high levels of doping in this material. High resolution Helium Ion Microscopy, Secondary Ion Mass Spectrometry and Transmission Electron Microscopy reveal a significant rearrangement of copper and chromium after the thermal treatments. Furthermore, Positron Annihilation Spectroscopy evidences the presence of vacancy defects within the delafossite layers which can be assigned to the Cu vacancy chains whose concentration decreases during the thermal process. These findings further confirm these chained vacancies as source of the p-type doping and suggest that the changes in electrical conductivities within the off-stoichiometric copper based delafossites are triggered by elemental rearrangements.

SUBMITTER: Lunca-Popa P

PROVIDER: S-EPMC6989665 | biostudies-literature | 2020 Jan

REPOSITORIES: biostudies-literature

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Tuneable interplay between atomistic defects morphology and electrical properties of transparent p-type highly conductive off-stoichiometric Cu-Cr-O delafossite thin films.

Lunca-Popa Petru P Botsoa Jacques J Bahri Mounib M Crêpellière Jonathan J Desgardin Pierre P Audinot Jean-Nicolas JN Wirtz Tom T Arl Didier D Ersen Ovidiu O Barthe Marie-France MF Lenoble Damien D

Scientific reports 20200129 1

Off-stoichiometric copper chromium delafossites demonstrate the highest values of electric conductivity among the p-type transparent conducting oxides. Morphological and structural changes in Cu0.66Cr1.33O2 upon annealing processes are investigated. Chained copper vacancies were previously suggested as source of the high levels of doping in this material. High resolution Helium Ion Microscopy, Secondary Ion Mass Spectrometry and Transmission Electron Microscopy r ...[more]

PMID: 31996739

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Project description:Delafossite materials are considered to be a promising range of transparent conductive oxides for optoelectronic applications. The complications that have held back their implementation in practical devices lie in the complex growth methods that are required and in the formation of undesirable secondary phases. Herein, a fast, simple, and low-cost deposition method allowing the deposition of high-quality 2H-CuFeO2 nanostructured thin films is employed. The effect of Sr doping on the properties of spray-coated CuFeO2 thin film annealed at 850 °C is reported. X-ray diffraction (XRD) analysis revealed the delafossite structures of all the samples corresponding to the 2H-CuFeO2 phase. The lattice spacing decreased with increasing substitution of Sr at the Cu site. Raman analysis further authenticated the structural results collected via XRD analysis. Surface scanning using field-emission scanning electron microscopy revealed the formation of nanostructured CuFeO2 thin film possessing high crystalline quality, with the nanocrystal size increasing as the dopant content was increased. Energy-dispersive X-ray analysis allowed the quantification of the elements content via determining the ratios of the main elements as well as the dopant content in each sample. The optical properties of the samples showed strong light absorption in the visible region with a decrease in the band gap values with Sr insertion. First-principles calculations using density functional theory (DFT) were conducted to strengthen the experimental findings regarding the nature of the bonds in the hexagonal lattice of the CuFeO2 compound and the effect of Sr doping on its characteristics. The electrical properties measured at room temperature revealed p-type conductivity with tunable resistivity, while the samples displayed increased electron mobility as a function of the dopant content. Consequently, our work introduced an efficient and cost-effective synthesis route for the preparation of high-quality nanostructured 2H-CuFeO2 thin films, paving the way to facilitate further device applications.

Dataset Information

Tuneable interplay between atomistic defects morphology and electrical properties of transparent p-type highly conductive off-stoichiometric Cu-Cr-O delafossite thin films.

Publications

Tuneable interplay between atomistic defects morphology and electrical properties of transparent p-type highly conductive off-stoichiometric Cu-Cr-O delafossite thin films.

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