Ontology highlight
ABSTRACT: Background
Improving abiotic stress tolerance in wheat requires large scale screening of yield components such as seed weight, seed number and single seed weight, all of which is very laborious, and a detailed analysis of seed morphology is time-consuming and visually often impossible. Computed tomography offers the opportunity for much faster and more accurate assessment of yield components.Results
An X-ray computed tomographic analysis was carried out on 203 very diverse wheat accessions which have been exposed to either drought or combined drought and heat stress. Results demonstrated that our computed tomography pipeline was capable of evaluating grain set with an accuracy of 95-99%. Most accessions exposed to combined drought and heat stress developed smaller, shrivell
SUBMITTER: Schmidt J
PROVIDER: S-EPMC7017466 | biostudies-literature | 2020
REPOSITORIES: biostudies-literature