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Organic-Component Dependent Crystal Orientation and Electrical Transport Properties in ALD/MLD Grown ZnO-Organic Superlattices.

ABSTRACT: Two series of ZnO-organic superlattice thin films are fabricated with systematically controlled frequencies of monomolecular hydroquinone (HQ) or terephthalic acid (TPA) based organic layers within the ZnO matrix using the atomic/molecular layer deposition (ALD/MLD) technique. The two different organic components turn the film orientation to different directions and affect the electrical transport properties differently. While the TPA layers enhance the c-axis orientation of the ZnO layers and act as electrical barriers depressing the electrical conductivity even in low concentrations, adding the HQ layers enhances the a-axis orientation and initially increases the carrier concentration, effective mass, and electrical conductivity. The work thus demonstrates the intriguing but little exploited role of the organic component in controlling the properties of the inorganic matrix in advanced layer-engineered inorganic-organic superlattices.

SUBMITTER: Ghiyasi R

PROVIDER: S-EPMC7493233 | biostudies-literature | 2020 Jun

REPOSITORIES: biostudies-literature

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Organic-Component Dependent Crystal Orientation and Electrical Transport Properties in ALD/MLD Grown ZnO-Organic Superlattices.

Ghiyasi Ramin R Tewari Girish C GC Karppinen Maarit M

The journal of physical chemistry. C, Nanomaterials and interfaces 20200601 25

Two series of ZnO-organic superlattice thin films are fabricated with systematically controlled frequencies of monomolecular hydroquinone (HQ) or terephthalic acid (TPA) based organic layers within the ZnO matrix using the atomic/molecular layer deposition (ALD/MLD) technique. The two different organic components turn the film orientation to different directions and affect the electrical transport properties differently. While the TPA layers enhance the <i>c</i>-axis orientation of the ZnO layer ...[more]

PMID: 32952772

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Project description:This work reports the ellipsometry analysis of atomic layer deposition (ALD) films of ZnO doped with Zr to determine parameters like free carrier concentration and mobility. Thin films of zinc oxide (ZnO) and Zr-doped ZnO of thickness ∼100 nm were prepared by atomic layer deposition on sapphire, SiO2/Si(100), and Si(100) substrates. Variable-angle spectroscopic ellipsometry was used to study their optical properties in the 0.5-3.5 eV spectral range. The optical constants were accurately obtained using a model that combines Drude and Tauc-Lorentz oscillators with Bruggeman effective medium approximations, allowing the inclusion of a roughness layer in the optical model. The effect of Zr doping (ca. 1.9-4.4 atom %) was then investigated in both as-prepared samples and samples annealed in the temperature range of 100-300 °C. All of the films exhibited good optical transparency (ca. 70-90% in the visible region). For doping levels below 2.7 atom %, the real part of the dielectric permittivity reveals a semiconductor-to-metal transition in the near-infrared (NIR) region, as the permittivity goes from positive to negative. Besides, the plasma energy increases with increasing Zr concentration, and both resistivity and carrier concentration exhibit slightly parabolic behaviors, with a minimum of ∼1.5 × 10-3 Ω cm and a maximum of 2.4 × 1020 cm-3, respectively, at the same critical Zr concentration (2.7 atom %). In contrast, the carrier mobility decreases rapidly from 76.0 to 19.2 cm2/(V s) with increasing Zr content, while conductivities and carrier mobilities worsen when the annealing temperature increases, probably due to the segregation of ZnO crystals. Finally, the optical band gap is very stable, revealing its interesting independence of substrate composition and annealing temperature, as it collapses to a single master curve when band gap energy is plotted versus free carrier concentration, following the Burstein-Moss effect. Overall, the Zr-doped ZnO films studied here would be a highly desirable system for developing thermally stable transparent conductive oxides (TCOs).

Dataset Information

Organic-Component Dependent Crystal Orientation and Electrical Transport Properties in ALD/MLD Grown ZnO-Organic Superlattices.

Publications

Organic-Component Dependent Crystal Orientation and Electrical Transport Properties in ALD/MLD Grown ZnO-Organic Superlattices.

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