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ABSTRACT:
SUBMITTER: Andrle A
PROVIDER: S-EPMC8056758 | biostudies-literature | 2021 Apr
REPOSITORIES: biostudies-literature
Andrle A A Hönicke P P Vinson J J Quintanilha R R Saadeh Q Q Heidenreich S S Scholze F F Soltwisch V V
Journal of applied crystallography 20210219 Pt 2
The refractive index of a <i>y</i>-cut SiO<sub>2</sub> crystal surface is reconstructed from orientation-dependent soft X-ray reflectometry measurements in the energy range from 45 to 620 eV. Owing to the anisotropy of the crystal structure in the (100) and (001) directions, a significant deviation of the measured reflectance at the Si <i>L</i> <sub>2,3</sub> and O <i>K</i> absorption edges is observed. The anisotropy in the optical constants reconstructed from these data is also confirmed by <i ...[more]