Ontology highlight
ABSTRACT:
SUBMITTER: Hassouna L
PROVIDER: S-EPMC8161361 | biostudies-literature | 2021 May
REPOSITORIES: biostudies-literature
Materials (Basel, Switzerland) 20210520 10
In this work, the use of Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) was explored as a technique for monitoring the interfacial retro Diels-Alder (retro DA) reaction occurring on well-controlled self-assembled monolayers (SAMs). A molecule containing a Diels-Alder (DA) adduct was grafted on to the monolayers, then the surface was heated at different temperatures to follow the reaction conversion. A TOF-SIMS analysis of the surface allowed the detection of a fragment from the molecu ...[more]