Ontology highlight
ABSTRACT: Electronic supplementary material
Supplementary material (results of the simulation and SEM) is available in the online version of this article at 10.1007/s12274-021-3670-y.
SUBMITTER: Guo Y
PROVIDER: S-EPMC8316888 | biostudies-literature | 2021
REPOSITORIES: biostudies-literature
Guo Yao Y Sun Yan Y Tang Alvin A Wang Ching-Hua CH Zhao Yanqing Y Bai Mengmeng M Xu Shuting S Xu Zheqi Z Tang Tao T Wang Sheng S Qiu Chenguang C Xu Kang K Peng Xubiao X Han Junfeng J Pop Eric E Chai Yang Y
Nano research 20210728 12
The inferior electrical contact to two-dimensional (2D) materials is a critical challenge for their application in post-silicon very large-scale integrated circuits. Electrical contacts were generally related to their resistive effect, quantified as contact resistance. With a systematic investigation, this work demonstrates a capacitive metal-insulator-semiconductor (MIS) field-effect at the electrical contacts to 2D materials: The field-effect depletes or accumulates charge carriers, redistribu ...[more]