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Double gate operation of metal nanodot array based single electron device.

ABSTRACT: Multidot single-electron devices (SEDs) can enable new types of computing technologies, such as those that are reconfigurable and reservoir-computing. A self-assembled metal nanodot array film that is attached to multiple gates is a candidate for use in such SEDs for achieving high functionality. However, the single-electron properties of such a film have not yet been investigated in conjunction with optimally controlled multiple gates because of the structural complexity of incorporating many nanodots. In this study, Fe nanodot-array-based double-gate SEDs were fabricated by vacuum deposition, and their single-electron properties (modulated by the top- and bottom-gate voltages; V_T and V_B, respectively) were investigated. The phase of the Coulomb blockade oscillation systematically shifted with V_T, indicating that the charge state of the single dot was controlled by both the gate voltages despite the metallic random multidot structure. This result demonstrates that the Coulomb blockade oscillation (originating from the dot in the multidot array) can be modulated by the two gates. The top and bottom gates affected the electronic state of the dot unevenly owing to the geometrical effect caused by the following: (1) vertically asymmetric dot shape and (2) variation of the dot size (including the surrounding dots). This is a characteristic feature of a nanodot array that uses self-assembled metal dots; for example, prepared by vacuum deposition. Such variations derived from a randomly distributed nanodot array will be useful in enhancing the functionality of multidot devices.

SUBMITTER: Gyakushi T

PROVIDER: S-EPMC9259697 | biostudies-literature |

REPOSITORIES: biostudies-literature

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Project description:Sensitive dispersive readouts of single-electron devices ("gate reflectometry") rely on one-port radio-frequency (RF) reflectometry to read out the state of the sensor. A standard practice in reflectometry measurements is to design an impedance transformer to match the impedance of the load to the characteristic impedance of the transmission line and thus obtain the best sensitivity and signal-to-noise ratio. This is particularly important for measuring large impedances, typical for dispersive readouts of single-electron devices because even a small mismatch will cause a strong signal degradation. When performing RF measurements, a calibration and error correction of the measurement apparatus must be performed in order to remove errors caused by unavoidable non-idealities of the measurement system. Lack of calibration makes optimizing a matching network difficult and ambiguous, and it also prevents a direct quantitative comparison between measurements taken of different devices or on different systems. We propose and demonstrate a simple straightforward method to design and optimize a pi matching network for readouts of devices with large impedance, [Formula: see text]. It is based on a single low temperature calibrated measurement of an unadjusted network composed of a single L-section followed by a simple calculation to determine a value of the "balancing" capacitor needed to achieve matching conditions for a pi network. We demonstrate that the proposed calibration/error correction technique can be directly applied at low temperature using inexpensive calibration standards. Using proper modeling of the matching networks adjusted for low temperature operation the measurement system can be easily optimized to achieve the best conditions for energy transfer and targeted bandwidth, and can be used for quantitative measurements of the device impedance. In this work we use gate reflectometry to readout the signal generated by arrays of parallel-connected Al-AlOx single-electron boxes. Such arrays can be used as a fast nanoscale voltage sensor for scanning probe applications. We perform measurements of sensitivity and bandwidth for various settings of the matching network connected to arrays and obtain strong agreement with the simulations.

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Double gate operation of metal nanodot array based single electron device.

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