Dataset Information

Specimen-displacement correction for powder X-ray diffraction in Debye-Scherrer geometry with a flat area detector.

ABSTRACT: The effect of small changes in the speci-men-to-detector distance on the unit-cell parameters is examined for synchrotron powder diffraction in Debye-Scherrer (transmission) geometry with a flat area detector. An analytical correction equation is proposed to fix the shift in 2θ values due to speci-men capillary displacement. This equation does not require the use of an internal reference material, is applied during the Rietveld refinement step, and is analogous to the speci-men-displacement correction equations for Bragg-Brentano and curved-detector Debye-Scherrer geometry experiments, but has a different functional form. The 2θ correction equation is compared with another speci-men-displacement correction based on the use of an internal reference material in which new integration and calibration parameters of area-detector images are determined. Example data sets showing the effect of a 3.3 mm speci-men displacement on the unit-cell parameters for 25°C CeO₂, including both types of displacement correction, are described. These experiments were performed at powder X-ray diffraction beamlines at the National Synchrotron Light Source II at Brookhaven National Laboratory and the Advanced Photon Source at Argonne National Laboratory.

SUBMITTER: Hulbert BS

PROVIDER: S-EPMC9901925 | biostudies-literature | 2023 Feb

REPOSITORIES: biostudies-literature

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Specimen-displacement correction for powder X-ray diffraction in Debye-Scherrer geometry with a flat area detector.

Hulbert Benjamin S BS Kriven Waltraud M WM

Journal of applied crystallography 20230201 Pt 1

The effect of small changes in the speci-men-to-detector distance on the unit-cell parameters is examined for synchrotron powder diffraction in Debye-Scherrer (transmission) geometry with a flat area detector. An analytical correction equation is proposed to fix the shift in 2θ values due to speci-men capillary displacement. This equation does not require the use of an internal reference material, is applied during the Rietveld refinement step, and is analogous to the speci-men-displacement corr ...[more]

PMID: 36777137

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Project description:In a test experiment, a two-dimensional pixel detector was mounted on the nine-channel multi-analyzer stage of the high-resolution powder diffraction beamline ID22 at the ESRF. This detector replaces a bank of scintillation counters that detect the diffracted intensity passing via the analyzer crystals as the diffractometer arm is scanned. At each diffractometer detector arm angle 2Θ, a 2D image is recorded that displays nine distinct regions of interest corresponding to the diffraction signals transmitted by each of the analyzer crystals. Summing pixels from within each region of interest allows the diffracted intensity to be extracted for each channel. X-rays are diffracted from the sample at various angles, 2θ, into Debye-Scherrer cones. Depending on the azimuthal angle around the cone, diffracted photons satisfy the analyzer-crystal Bragg condition at different diffractometer 2Θ values and arrive on the detector at different horizontal (axial) positions. The more the azimuthal angle deviates from diffraction in the vertical plane, the lower the 2Θ angle at which it is transmitted by an analyzer crystal, and the greater the distance of the detecting pixel from the centerline of the detector. This paper illustrates how the axial resolution afforded by the pixel detector can be used to correct the apparent diffraction angle, 2Θ, given by the diffractometer arm to its true diffraction angle, 2θ. This allows a reduction in peak asymmetry at low angle, and even with a relatively small axial acceptance, the correction leads to narrower peaks than if no correction is applied. By varying axial acceptance with diffraction angle, it is possible to optimize angular resolution at low diffraction angles and counting statistics at high angles. In addition, there is an intrinsic peak broadening with increasing azimuthal angle, dependent on the axial beam and detector pixel sizes. This effect reduces with 2θ, as the curvature of the Debye-Scherrer cones decreases. This broadening can be estimated and used to help choose the axial range to include as a function of diffraction angle.

Dataset Information

Specimen-displacement correction for powder X-ray diffraction in Debye-Scherrer geometry with a flat area detector.

Publications

Specimen-displacement correction for powder X-ray diffraction in Debye-Scherrer geometry with a flat area detector.

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