Dataset Information

Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement.

ABSTRACT: Defect depth profiles of Cu (In1-x,Gax)(Se1-ySy)2 (CIGSS) were measured as functions of pulse width and voltage via deep-level transient spectroscopy (DLTS). Four defects were observed, i.e., electron traps of ~0.2?eV at 140?K (E1 trap) and 0.47?eV at 300?K (E2 trap) and hole traps of ~0.1?eV at 100?K (H1 trap) and ~0.4?eV at 250?K (H2 trap). The open circuit voltage (VOC) deteriorated when the trap densities of E2 were increased. The energy band diagrams of CIGSS were also obtained using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and DLTS data. These results showed that the valence band was lowered at higher S content. In addition, it was found that the E2 defect influenced the VOC and could be interpreted as an extended defect. Defect depth profile images provided clear insight into the identification of defect state and density as a function of depth around the space charge region.

SUBMITTER: Heo S

PROVIDER: S-EPMC4967860 | biostudies-other | 2016

REPOSITORIES: biostudies-other

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Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement.

Heo Sung S Chung JaeGwan J Lee Hyung-Ik HI Lee Junho J Park Jong-Bong JB Cho Eunae E Kim KiHong K Kim Seong Heon SH Park Gyeong Su GS Lee Dongho D Lee Jaehan J Nam Junggyu J Yang JungYup J Lee Dongwha D Cho Hoon Young HY Kang Hee Jae HJ Choi Pyung-Ho PH Choi Byoung-Deog BD

Scientific reports 20160801

Defect depth profiles of Cu (In1-x,Gax)(Se1-ySy)2 (CIGSS) were measured as functions of pulse width and voltage via deep-level transient spectroscopy (DLTS). Four defects were observed, i.e., electron traps of ~0.2 eV at 140 K (E1 trap) and 0.47 eV at 300 K (E2 trap) and hole traps of ~0.1 eV at 100 K (H1 trap) and ~0.4 eV at 250 K (H2 trap). The open circuit voltage (VOC) deteriorated when the trap densities of E2 were increased. The energy band diagrams of CIGSS were also obtained using Auger ...[more]

PMID: 27476672

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Dataset Information

Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement.

Publications

Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement.

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