Ontology highlight
ABSTRACT:
SUBMITTER: Mao D
PROVIDER: S-EPMC2800856 | biostudies-literature | 2010 Jan
REPOSITORIES: biostudies-literature
Mao Dan D Wucher Andreas A Winograd Nicholas N
Analytical chemistry 20100101 1
Secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by 40 keV C(60)(+) bombardment of a 395 nm thin film of Irganox 1010 doped with four delta layers of Irganox 3114. The wedge structure creates a laterally magnified cross section of the film. From an examination of the resulting surface, information about depth resolution, topography, and erosion rate can be obtained as a function of crater depth in a single experiment. This prot ...[more]