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Molecular depth profiling with cluster secondary ion mass spectrometry and wedges.

ABSTRACT: Secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by 40 keV C(60)(+) bombardment of a 395 nm thin film of Irganox 1010 doped with four delta layers of Irganox 3114. The wedge structure creates a laterally magnified cross section of the film. From an examination of the resulting surface, information about depth resolution, topography, and erosion rate can be obtained as a function of crater depth in a single experiment. This protocol provides a straightforward way to determine the parameters necessary to characterize molecular depth profiles and to obtain an accurate depth scale for erosion experiments.

SUBMITTER: Mao D

PROVIDER: S-EPMC2800856 | biostudies-literature | 2010 Jan

REPOSITORIES: biostudies-literature

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Molecular depth profiling with cluster secondary ion mass spectrometry and wedges.

Mao Dan D Wucher Andreas A Winograd Nicholas N

Analytical chemistry 20100101 1

Secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by 40 keV C(60)(+) bombardment of a 395 nm thin film of Irganox 1010 doped with four delta layers of Irganox 3114. The wedge structure creates a laterally magnified cross section of the film. From an examination of the resulting surface, information about depth resolution, topography, and erosion rate can be obtained as a function of crater depth in a single experiment. This prot ...[more]

PMID: 19968247

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