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Surface Morphology Analysis of Metallic Structures Formed on Flexible Textile Composite Substrates.


ABSTRACT: This paper compares methods for measuring selected morphological features on the surface of thin metallic layers applied to flexible textile substrates. The methods were tested on a silver layer with a thickness of several hundred nanometers, which was applied to a textile composite with the trade name Cordura. Measurements were carried out at the micro scale using both optical coherent tomography (OCT) and the traditional contact method of using a profilometer. Measurements at the micro-scale proved the superiority of the OCT method over the contact method. The method of contactless measurement employs a dedicated algorithm for three-dimensional surface image analysis and does not affect the delicate surface structure of the measured layer in any way. Assessment of the surface profile of textile substrates and the thin films created on them, is important when estimating the contact angle, wetting behavior, or mechanical durability of the created metallic structure that can be used as the electrodes or elements of wearable electronics or textronics systems.

SUBMITTER: Korzeniewska E 

PROVIDER: S-EPMC7180940 | biostudies-literature | 2020 Apr

REPOSITORIES: biostudies-literature

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Surface Morphology Analysis of Metallic Structures Formed on Flexible Textile Composite Substrates.

Korzeniewska Ewa E   Korzeniewska Ewa E   Sekulska-Nalewajko Joanna J   Gocławski Jarosław J   Rosik Radosław R   Szczęsny Artur A   Starowicz Zbigniew Z  

Sensors (Basel, Switzerland) 20200409 7


This paper compares methods for measuring selected morphological features on the surface of thin metallic layers applied to flexible textile substrates. The methods were tested on a silver layer with a thickness of several hundred nanometers, which was applied to a textile composite with the trade name Cordura. Measurements were carried out at the micro scale using both optical coherent tomography (OCT) and the traditional contact method of using a profilometer. Measurements at the micro-scale p  ...[more]

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