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Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts.


ABSTRACT: Non-destructive characterization of decorated porcelain artifacts requires the joint use of surface-analytical methods for the decorative surface pattern and methods of high penetration depth for bulk-representative chemical composition. In this research, we used position-sensitive X-ray Fluorescence Spectrometry (XRF) and Prompt-gamma activation analysis (PGAA) for these purposes, assisted by 3D structured-light optical scanning and dual-energy X-ray radiography. The proper combination of the near-surface and bulk element composition data can shed light on raw material use and manufacturing technology of ceramics.

SUBMITTER: Szentmiklosi L 

PROVIDER: S-EPMC9330006 | biostudies-literature |

REPOSITORIES: biostudies-literature

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