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Yeast Tilt Series Collected on Lamella Generated by Fully Automated FIB Milling


ABSTRACT:

SUBMITTER: Martin Pilhofer 

PROVIDER: EMPIAR-10376 | biostudies-other |

REPOSITORIES: biostudies-other

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Fully automated, sequential focused ion beam milling for cryo-electron tomography.

Zachs Tobias T   Schertel Andreas A   Medeiros João J   Weiss Gregor L GL   Hugener Jannik J   Matos Joao J   Pilhofer Martin M  

eLife 20200309


Cryo-electron tomography (cryoET) has become a powerful technique at the interface of structural biology and cell biology, due to its unique ability for imaging cells in their native state and determining structures of macromolecular complexes in their cellular context. A limitation of cryoET is its restriction to relatively thin samples. Sample thinning by cryo-focused ion beam (cryoFIB) milling has significantly expanded the range of samples that can be analyzed by cryoET. Unfortunately, cryoF  ...[more]

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