Ontology highlight
ABSTRACT:
SUBMITTER: Kiener D
PROVIDER: S-EPMC3172822 | biostudies-other | 2011 Sep
REPOSITORIES: biostudies-other
Nano letters 20110801 9
A unique method for quantitative in situ nanotensile testing in a transmission electron microscope employing focused ion beam fabricated specimens was developed. Experiments were performed on copper samples with minimum dimensions in the 100-200 nm regime oriented for either single slip or multiple slip, respectively. We observe that both frequently discussed mechanisms, truncation of spiral dislocation sources and exhaustion of defects available within the specimen, contribute to high strengths ...[more]