Ontology highlight
ABSTRACT:
SUBMITTER: Kiener D
PROVIDER: S-EPMC3573867 | biostudies-other | 2012 Nov
REPOSITORIES: biostudies-other
Kiener Daniel D Kaufmann Petra P Minor Andrew M AM
Advanced engineering materials 20120507 11
We present in situ transmission electron microscope tensile tests on focused ion beam fabricated single and multiple slip oriented Cu tensile samples with thicknesses in the range of 100-200 nm. Both crystal orientations fail by localized shear. While failure occurs after a few percent plastic strain and limited hardening in the single slip case, the multiple slip samples exhibit extended homogenous deformation and necking due to the activation of multiple dislocation sources in conjunction with ...[more]