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Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films.

ABSTRACT: The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using >50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin films with high resolution. Compared with grazing-incidence wide-angle X-ray scattering, which is only useful for highly ordered materials, GITXS/PDFs expand such analysis to largely disordered or nanostructured materials by examining the atomic pair correlations dependent on the direction relative to the surface of the supporting substrate. A characterization of nanocrystalline In₂O₃-derived thin films is presented here with in-plane-isotropic and out-of-plane-anisotropic orientational ordering of the atomic structure, each synthesized using different techniques. The atomic orientations of such films are known to vary based on the synthetic conditions. Here, an azimuthal orientational analysis of these films using GITXS with a single incident angle is shown to resolve the markedly different orientations of the atomic structures with respect to the planar support and the different degrees of long-range order, and hence, the terminal surface chemistries. It is anticipated that orientational analysis of GITXS/PDF data will offer opportunities to extend structural analyses of thin films by providing a means to qualitatively determine the major atomic orientation within nanocrystalline and, eventually, non-crystalline films.

SUBMITTER: Hoffman JM

PROVIDER: S-EPMC10833382 | biostudies-literature | 2024 Jan

REPOSITORIES: biostudies-literature

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Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films.

Hoffman Justin M JM Thompson Niklas B NB Borkiewicz Olaf O He Xiang X Amsterdam Samuel S Xie Zhu Lin ZL Taggart Aaron A Mulfort Karen L KL Martinson Alex B F ABF Chen Lin X LX Ruett Uta U Tiede David M DM

IUCrJ 20240101 Pt 1

The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using >50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin films with high resolution. Compared with grazing-incidence wide-angle X-ray scattering, which is only useful for highly ordered materials, GITXS/PDFs expand such analysis to largely disordered or nanostructured materials by examining the atomic pair cor ...[more]

PMID: 38133556

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Dataset Information

Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films.

Publications

Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films.

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