Ontology highlight
ABSTRACT:
SUBMITTER: Seiboth F
PROVIDER: S-EPMC5337966 | biostudies-literature | 2017 Mar
REPOSITORIES: biostudies-literature
Seiboth Frank F Schropp Andreas A Scholz Maria M Wittwer Felix F Rödel Christian C Wünsche Martin M Ullsperger Tobias T Nolte Stefan S Rahomäki Jussi J Parfeniukas Karolis K Giakoumidis Stylianos S Vogt Ulrich U Wagner Ulrich U Rau Christoph C Boesenberg Ulrike U Garrevoet Jan J Falkenberg Gerald G Galtier Eric C EC Ja Lee Hae H Nagler Bob B Schroer Christian G CG
Nature communications 20170301
Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limi ...[more]