Ontology highlight
ABSTRACT:
SUBMITTER: Necas D
PROVIDER: S-EPMC7499267 | biostudies-literature | 2020 Sep
REPOSITORIES: biostudies-literature
Nečas David D Valtr Miroslav M Klapetek Petr P
Scientific reports 20200917 1
Surface roughness plays an important role in various fields of nanoscience and nanotechnology. However, the present practices in roughness measurements, typically based on some Atomic Force Microscopy measurements for nanometric roughness or optical or mechanical profilometry for larger scale roughness significantly bias the results. Such biased values are present in nearly all the papers dealing with surface parameters, in the areas of nanotechnology, thin films or material science. Surface rou ...[more]